Manipal University Jaipur (MUJ) marked another significant milestone with the addition of Atomic Force Microscope (AFM) to the Central Research facilities under Directorate of Research. The advance set up has been inaugurated by the President of MUJ, Prof. (Dr) N N Sharma, in the gracious presence of Pro-President Cdr. (Dr.) Anil Rana, Registrar Dr. Amit Soni, Dean-FoSTA Dr. Kuldip Singh Sangwan, Dean-RIAAA Dr. Lalita Ledwani, Provost Dr. Nitu Bhatnagar and other academic leaders.

The addition of this advanced instrument further strengthens the research ecosystem at MUJ. Highlights of the Atomic Force Microscope (AFM): High-resolution imaging of surfaces at the nanoscale. Three-dimensional surface topography and nanoscale roughness analysis. Characterization of surface morphology and material properties. Applications across interdisciplinary domains for: Surface roughness, height profile and 3D image of various, nanomaterials, soft materials, biological materials etc. Electrical property mapping (current and capacitance). Direct mapping of nanomechanical properties, including elastic modulus, adhesion, and dissipation, at high resolution and normal scan rates. This initiative reflects MUJ’s continued commitment to strengthening its central laboratory facilities, promoting interdisciplinary collaboration, enabling advanced scientific investigations, and fostering innovation-driven research.

The enhanced infrastructure will support faculty members, research scholars, and students in pursuing high-quality research and exploring new frontiers in science and technology.”